Journal article
Logistic Localized Modeling of the Sample Space for Feature Selection and Classification
Abstract
Authors
Armanfard N; Reilly JP; Komeili M
Journal
IEEE Transactions on Neural Networks and Learning Systems, Vol. 29, No. 5, pp. 1396–1413
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 1, 2018
DOI
10.1109/tnnls.2017.2676101
ISSN
2162-237X