Conference
Validation of Convolution Based Forced Detection SIMIND with Analytical Collimator Response Modeling Using Gate
Abstract
Authors
Karamat MI; Farncombe TH
Pagination
pp. 1-6
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2014
DOI
10.1109/nssmic.2014.7430827
Name of conference
2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)