Journal article
Accelerated SPECT Monte Carlo Simulation Using Multiple Projection Sampling and Convolution-Based Forced Detection
Abstract
Authors
Liu S; King MA; Brill AB; Stabin MG; Farncombe TH
Journal
IEEE Transactions on Nuclear Science, Vol. 55, No. 1, pp. 560–567
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2008
DOI
10.1109/tns.2007.914038
ISSN
0018-9499