Conference
Accelerated SPECT Monte Carlo Simulation using Multiple Projection Sampling and Convolution-based Forced Detection
Abstract
Monte Carlo (MC) is a well utilized tool for simulating photon transports in single photon emission computed tomography (SPECT) due to its capability for high accuracy. As a consequence of this accuracy, it suffers from a relatively low detection efficiency, and thus long computation times. One technique used to improve the speed of MC modeling is the effective and well established variance reduction technique (VRT) known as forced detection …
Authors
Liu S; King MA; Brill AB; Stabin MG; Farncombe TH
Volume
5
Pagination
pp. 3142-3147
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
October 1, 2006
DOI
10.1109/nssmic.2006.356541
Name of conference
2006 IEEE Nuclear Science Symposium Conference Record