Conference
A new wafer-bonder of ultra-high precision using surface activated bonding (SAB) concept
Abstract
Authors
Suga T; Howlader MMR; Itoh T; Inaka C; Arai Y; Yamauchi A
Pagination
pp. 1013-1018
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2001
DOI
10.1109/ectc.2001.927935
Name of conference
2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220)