Conference
Improving Test Generation under Rich Contracts by Tight Bounds and Incremental SAT Solving
Abstract
Authors
Abad P; Aguirre N; Bengolea V; Ciolek D; Frias MF; Galeotti J; Maibaum T; Moscato M; Rosner N; Vissani I
Pagination
pp. 21-30
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2013
DOI
10.1109/icst.2013.46
Name of conference
2013 IEEE Sixth International Conference on Software Testing, Verification and Validation