Conference
Sequential Monte Carlo filtering vs. the IMM estimator for fault detection and isolation in nonlinear systems
Authors
Kadirkamanathan V; Li P; Kirubarajan T
Volume
4389
Pagination
pp. 263-274
Publisher
SPIE, the international society for optics and photonics
Publication Date
July 20, 2001
DOI
10.1117/12.434246
Name of conference
Component and Systems Diagnostics, Prognosis, and Health Management
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X