Automated trace signals selection using the RTL descriptions Conferences

authors

• Ko, Ho Fai
• Nicolici, Nicola

status

• published 

publication date

• November 2010

published in

• IEEE International Test Conference (TC)  Journal

presented at event

• 2010 IEEE International Test Conference (ITC)  Conference

keywords

• Engineering
• Engineering, Electrical & Electronic
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1109/test.2010.5699214