Conference
An ought-to-do deontic logic for reasoning about fault-tolerance: the diarrheic philosophers
Abstract
Authors
Castro PF; Maibaum TSE
Pagination
pp. 151-156
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2007
DOI
10.1109/sefm.2007.7
Name of conference
Fifth IEEE International Conference on Software Engineering and Formal Methods (SEFM 2007)