publication venue for
- Joint modeling of degradation signals and time-to-event data for the prediction of remaining useful life 2024
- Robust inference for nondestructive one‐shot device testing under step‐stress model with exponential lifetimes. 39:1192-1222. 2023
- Bootstrap control charts for quantiles based on log‐symmetric distributions with applications to the monitoring of reliability data. 39:1-24. 2023
- EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan. 38:780-799. 2022
- Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis. 38:989-1012. 2022
- Inverse Gaussian process model with frailty term in reliability analysis. 37:763-784. 2021
- Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses. 36:1916-1930. 2020
- Remaining useful life prediction for multivariable stochastic degradation systems with non‐Markovian diffusion processes. 36:1402-1421. 2020
- On the performance of coefficient of variation charts in the presence of measurement errors. 35:329-350. 2019
- Reliability assessment of high‐quality and long‐life products based on zero‐failure data. 35:470-482. 2019
- On the Performance of Shewhart median Chart in the Presence of Measurement Errors. 33:1019-1029. 2017
- A Generally Weighted Moving Average Signed‐rank Control Chart. 32:2835-2845. 2016
- One‐sided Control Charts Based on Precedence and Weighted Precedence Statistics. 31:113-134. 2015
- Computer systems availability evaluation using a segregated failures model. 24:447-465. 2008