Robust inference for nondestructive one‐shot device testing under step‐stress model with exponential lifetimes

Abstract One‐shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of one‐shot devices do not get destroyed when tested, and so can continue within the experiment, providing extra information for inference, if they did not fail before an inspection time. In addition, their reliability can be rapidly estimated via accelerated …