publication venue for
- X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires. 53:1310-1320. 2020
- Complete structural and strain analysis of single GaAs/(In,Ga)As/GaAs core–shell–shell nanowires by means of in-plane and out-of-plane X-ray nanodiffraction. 51:1387-1395. 2018
- Determination of temperature-dependent crystallographic parameters of Al–Si alloys using in situ neutron diffraction. 51:1141-1150. 2018
- Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging. 50:673-680. 2017
- Specification of the Crystallographic Information File format, version 2.0. 49:277-284. 2016
- Scattering from laterally heterogeneous vesicles. III. Reconciling past and present work. 40:771-772. 2007
- Scattering from laterally heterogeneous vesicles. II. The form factor. 40:513-525. 2007
- Scattering from laterally heterogeneous vesicles. I. Model-independent analysis. 39:791-796. 2006
- A Crystallographic Information File for specular reflectivity data. 39:468-468. 2006
- Method of separated form factors for polydisperse vesicles. 39:293-303. 2006
- VALENCE: a program for calculating bond valences. 29:479-480. 1996
- Anomalous small-angle-X-ray scattering on Al–Zn and Al–Zn–Ag alloys. 18:480-486. 1985
- Determination of anomalous scattering factors for zinc and silver in Al–Zn–Ag alloys. 18:181-183. 1985
- Determination of the anomalous scattering factors for Cu, Ni and Ti using the dispersion relation. 17:344-351. 1984