Journal article
Defect-Enhanced Silicon-on-Insulator Waveguide Resonant Photodetector With High Sensitivity at 1.55 $\mu$m
Abstract
We describe the fabrication and characterization of a silicon waveguide resonant photodetector compatible with the optical-to-electrical conversion of wavelengths at, or around, 1550 nm. Sub-band responsivity is provided through the introduction of defects via inert self-implantation and subsequent annealing. The detector is located within a 20- m radius silicon microring resonator. An 18-dB resonant enhancement in absorption coefficient and …
Authors
Logan DF; Velha P; Sorel M; De La Rue RM; Knights AP; Jessop PE
Journal
IEEE Photonics Technology Letters, Vol. 22, No. 20, pp. 1530–1532
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
October 1, 2010
DOI
10.1109/lpt.2010.2066963
ISSN
1041-1135