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Pockels’ effect in polycrystalline ZnS planar...
Journal article

Pockels’ effect in polycrystalline ZnS planar waveguides

Abstract

The Pockels’ effect has been demonstrated in thermally evaporated polycrystalline thin films of ZnS. The strongly (111)-oriented films were found to have an electro-optic constant of r41 = 3.3 × 10−13 m/V for fields perpendicular to the (111) planes. Extinction ratios of up to 85% have been observed in an optical waveguide modulator. Analysis indicates a stress-related birefringence that manifests itself upon temperature change. The temperature coefficient of stress in the polycrystalline films was found to be 3.0×105 N m−2/°C.

Authors

Wong B; Jessop PE; Kitai AH

Journal

Journal of Applied Physics, Vol. 70, No. 3, pp. 1180–1184

Publisher

AIP Publishing

Publication Date

August 1, 1991

DOI

10.1063/1.350359

ISSN

0021-8979

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