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Improved structural and optical properties of...
Conference

Improved structural and optical properties of InGaAsP grown on InP by ECR plasma-assisted epitaxy

Abstract

In this work, plasma-assisted epitaxy is be shown to be an alternative technique for reducing the lateral composition modulation (LCM) in thick InGaAsP layers and single quantum wells (QWs) grown on (100) InP substrates.

Authors

LaPierre RR; Robinson BJ; Thompson DA

Pagination

pp. 517-520

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

January 1, 1996

DOI

10.1109/iciprm.1996.492297

Name of conference

Proceedings of 8th International Conference on Indium Phosphide and Related Materials