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Characterization of annealed high-resistivity InP...
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Characterization of annealed high-resistivity InP grown by He-plasma-assisted epitaxy

Abstract

In this work we report on the effect of annealing high-resistivity InP grown by gas source molecular beam epitaxy in the presence of an electron cyclotron resonance generated He plasma. Previous work has shown that InP grown using this technique exhibits resistivity greater than 105 Ω cm and Be-doped InGaAsP (lattice matched to InP, band-gap wavelength 1.5 μm) exhibits subpicosecond carrier lifetime. This behavior is due to the presence of …

Authors

Pinkney H; Thompson DA; Robinson BJ; Mascher P; Simpson PJ; Myler U; Kang JU; Frankel MY

Volume

16

Pagination

pp. 772-775

Publisher

American Vacuum Society

Publication Date

March 1, 1998

DOI

10.1116/1.581057

Conference proceedings

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Issue

2

ISSN

0734-2101