Microscopic Strain Mapping Using Scanning Electron Microscopy Topography Image Correlation at Large Strain

Measuring the distribution of local strain at the microscopic level is a challenging problem, especially for materials subjected to large overall strain. In the present study, a novel microscopic strain mapping technique has been developed based on the analysis of surface topography using digital image correlation (DIC) software. The input is a series of scanning electron microscopy (SEM) images. The method uses topographic features (such as …