Journal article
Strain mapping by measurement of the degree of polarization of photoluminescence.
Abstract
A technique is described for the simultaneous measurement of the difference in the normal components of strain and of the shear strain in luminescent III-V material from the degree of polarization (DOP) of photoluminescence. This technique for the measurement of shear strain and of the difference in the normal components of strain in InP was calibrated by applying known external loads on the bars of InP with V grooves etched into the bars and …
Authors
Cassidy DT; Lam SKK; Lakshmi B; Bruce DM
Journal
Applied Optics, Vol. 43, No. 9, pp. 1811–1818
Publisher
Optica Publishing Group
Publication Date
March 19, 2004
DOI
10.1364/ao.43.001811
ISSN
1559-128X