Conference
Optimal inspection intervals in a two-stage manufacturing process
Abstract
A strategy suggested recently in the literature for enhancing quality is to use inspection sublots, in which a large production run (batch) is subdivided into smaller portions (sublots) for inspection. In this study we consider a two-stage batch manufacturing process in which the first stage shifts out-of-control at i.i.d. exponential times after starting in control. In any sublot, Stage 1 produces good items before the shift and bad items …
Authors
Vickson RG; Hassini E
Volume
1
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 1998
DOI
10.1109/icsmc.1998.725439
Name of conference
SMC'98 Conference Proceedings. 1998 IEEE International Conference on Systems, Man, and Cybernetics (Cat. No.98CH36218)
Conference proceedings
IEEE SMC'99 Conference Proceedings 1999 IEEE International Conference on Systems, Man, and Cybernetics (Cat No99CH37028)
ISSN
1062-922X