Conference
The test vector problem and limitations to evolving digital circuits
Abstract
Authors
Imamura K; Foster JA; Krings AW
Pagination
pp. 75-79
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2000
DOI
10.1109/eh.2000.869344
Name of conference
Proceedings. The Second NASA/DoD Workshop on Evolvable Hardware