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A Comprehensive Photon Detection Probability Model...

A Comprehensive Photon Detection Probability Model for CMOS Single-Photon Avalanche Diodes

Abstract

Photon detection probability (PDP) modeling is essential for optimizing CMOS single-photon avalanche diode (SPAD) designs. However, process variations and experimental non-idealities can hinder accurate PDP predictions. To address these challenges, an improved PDP model is proposed and validated against the measured data.

Authors

Qian X; Gao Z; Chen J; Deen MJ; Jiang W

Volume

00

Pagination

pp. 1-2

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

November 13, 2025

DOI

10.1109/ipc65510.2025.11282411

Name of conference

2025 IEEE Photonics Conference (IPC)

Associated Experts

Jamal Deen

Professor, Faculty of Engineering

WEI JIANG

Adjunct Assistant Professor, Faculty of Engineering

Labels

Fields of Research (FoR)

40 Engineering 4009 Electronics, Sensors and Digital Hardware

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