Journal article
Optimal progressively censored reliability sampling plans for log-location-scale distributions
Abstract
Authors
Lin C-T; Jian S-L; Balakrishnan N
Journal
Quality Technology & Quantitative Management, Vol. 23, No. 4, pp. 711–734
Publisher
Taylor & Francis
Publication Date
July 4, 2026
DOI
10.1080/16843703.2025.2559068
ISSN
1684-3703
