Journal article
Optimal progressively censored reliability sampling plans for log-location-scale distributions
Abstract
Authors
Lin C-T; Jian S-L; Balakrishnan N
Journal
Quality Technology & Quantitative Management, Vol. ahead-of-print, No. ahead-of-print, pp. 1–24
Publisher
Taylor & Francis
Publication Date
January 1, 2025
DOI
10.1080/16843703.2025.2559068
ISSN
1684-3703