Conference
Electrical characterization of semiconductor nanowires by scanning tunneling microscopy
Authors
Durand C; Capoid P; Berthe M; Xu T; Nys J-P; Leturcq R; Caroff P; Grandidier B
Volume
8996
Publisher
SPIE, the international society for optics and photonics
Publication Date
February 19, 2014
DOI
10.1117/12.2042767
Name of conference
Quantum Dots and Nanostructures: Synthesis, Characterization, and Modeling XI
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X