Conference
A 2-D Noise Model for CMOS Single Photon Avalanche Diodes
Abstract
Recent advances have enabled single-photon avalanche diodes (SPADs) to be fully integrated with CMOS signal conditioning and processing circuits, paving the way for compact and efficient imaging applications. However, a significant challenge remains: the absence of accurate models for optimizing the SPAD design prior to fabrication. In this paper, we present a comprehensive noise model and compare simulation results with experimental …
Authors
Qian X; Jiang W; Deen MJ
Volume
00
Pagination
pp. 1-3
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 12, 2025
DOI
10.1109/edtm61175.2025.11040184
Name of conference
2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)