Journal article
Improvement of Boron Dopant Quantification Accuracy in Atom Probe Tomography via High Electric Field Analysis
Authors
Guerguis B; Cuduvally R; Morris RJH; Arcuri G; Langelier B; Bassim N
Journal
Microscopy and Microanalysis, Vol. 30, No. Supplement_1,
Publisher
Oxford University Press (OUP)
Publication Date
July 24, 2024
DOI
10.1093/mam/ozae044.036
ISSN
1431-9276