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A comprehensive calibration of integrated...
Journal article

A comprehensive calibration of integrated magnetron sputtering and plasma enhanced chemical vapor deposition for rare-earth doped thin films

Abstract

A new integrated deposition system taking advantage of magnetron sputtering and electron cyclotron-plasma enhanced chemical vapour deposition (IMS ECR-PECVD) is presented that mitigates the drawbacks of each fabrication system. This tailor-made system provides users with highly homogeneous and pure thin films with less undesired hydrogen and well-controlled rare-earth concentration compared to existing methods of rare-earth doping, such as …

Authors

Khatami Z; Wolz L; Wojcik J; Mascher P

Journal

Journal of Materials Research, Vol. 39, No. 1, pp. 150–164

Publisher

Springer Nature

Publication Date

January 14, 2024

DOI

10.1557/s43578-023-01207-2

ISSN

0884-2914