Journal article
A comprehensive calibration of integrated magnetron sputtering and plasma enhanced chemical vapor deposition for rare-earth doped thin films
Abstract
A new integrated deposition system taking advantage of magnetron sputtering and electron cyclotron-plasma enhanced chemical vapour deposition (IMS ECR-PECVD) is presented that mitigates the drawbacks of each fabrication system. This tailor-made system provides users with highly homogeneous and pure thin films with less undesired hydrogen and well-controlled rare-earth concentration compared to existing methods of rare-earth doping, such as …
Authors
Khatami Z; Wolz L; Wojcik J; Mascher P
Journal
Journal of Materials Research, Vol. 39, No. 1, pp. 150–164
Publisher
Springer Nature
Publication Date
January 14, 2024
DOI
10.1557/s43578-023-01207-2
ISSN
0884-2914