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Optical techniques for probing semiconductor...
Conference

Optical techniques for probing semiconductor surfaces and interfaces

Authors

Power JR; Weightman P; Farrell T; Gerber P; Rumberg J; Chandola S; McGilp JF

Editors

Jauho AP; Buzaneva EV

Series

NATO ADVANCED SCIENCE INSTITUTES SERIES, SERIES E, APPLIED SCIENCES

Volume

328

Pagination

pp. 163-167

Publisher

KLUWER ACADEMIC PUBL

Publication Date

January 1, 1996

ISBN-10

0-7923-4301-8

Name of conference

NATO Advanced Study Institute on Frontiers in Nanoscale Science of Micron/Submicron Devices

Conference place

UKRAINE, KIEV

Conference start date

August 16, 1995

Conference end date

August 26, 1995

Conference proceedings

FRONTIERS IN NANOSCALE SCIENCE OF MICRON/SUBMICRON DEVICES

ISSN

0168-132X

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