Journal article
Tests for Multiple Outliers in an Exponential Sample
Abstract
By applying the recursion of Huffer (1988) repeatedly, we propose an algorithm for evaluating the null joint distribution of Dixon-type test statistics for testing discordancy of k upper outliers in exponential samples. By using the critical values of Dixon-type test statistics determined from the proposed algorithm and those of Cochran-type test statistics presented earlier by Lin and Balakrishnan (2009), we carry out an extensive Monte Carlo …
Authors
Lin C-T; Balakrishnan N
Journal
Communications in Statistics - Simulation and Computation, Vol. 43, No. 4, pp. 706–722
Publisher
Taylor & Francis
Publication Date
January 2014
DOI
10.1080/03610918.2012.714030
ISSN
0361-0918