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Tests for Multiple Outliers in an Exponential...
Journal article

Tests for Multiple Outliers in an Exponential Sample

Abstract

By applying the recursion of Huffer (1988) repeatedly, we propose an algorithm for evaluating the null joint distribution of Dixon-type test statistics for testing discordancy of k upper outliers in exponential samples. By using the critical values of Dixon-type test statistics determined from the proposed algorithm and those of Cochran-type test statistics presented earlier by Lin and Balakrishnan (2009), we carry out an extensive Monte Carlo …

Authors

Lin C-T; Balakrishnan N

Journal

Communications in Statistics - Simulation and Computation, Vol. 43, No. 4, pp. 706–722

Publisher

Taylor & Francis

Publication Date

January 2014

DOI

10.1080/03610918.2012.714030

ISSN

0361-0918