Journal article
Optimal Step-Stress Test Under Progressive Type-I Censoring
Abstract
Authors
Evans G; Ananda S; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 53, No. 3, pp. 388–393
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
September 1, 2004
DOI
10.1109/tr.2004.833320
ISSN
0018-9529