Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing

For devices with long lifetimes, accelerated life-tests are commonly used to induce quick failures. A link function relating stress levels and lifetime is then applied to extrapolate the lifetimes of units from accelerated conditions to normal operating conditions. Because data from one-shot devices do not contain any lifetimes, a standard reliability analysis with a parametric distributional assumption on lifetimes may be sensitive to …