Journal article
Exact Nonparametric Inference for Component and System Lifetime Distributions Based on Joint Signatures
Abstract
Authors
Balakrishnan N; Volterman W
Journal
IEEE Transactions on Reliability, Vol. 65, No. 1, pp. 179–186
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2016
DOI
10.1109/tr.2015.2458853
ISSN
0018-9529