Goodness-of-fit tests for one-shot device accelerated life testing data

In this article, we develop a formal goodness-of-fit testing procedure for one-shot device testing data, in which each observation in the sample is either left censored or right censored. Such data are also called current status data. We provide an algorithm for calculating the nonparametric maximum likelihood estimate (NPMLE) of the unknown lifetime distribution based on such data. Then, we consider four different test statistics that can be …