Journal article
Low energy Auger electron spectroscopy of titanium nitrides for quantitative analysis
Abstract
The potential of the low energy (20–30 eV) region of the Auger spectrum of titanium nitrides for quantitative analysis has been examined. Nitride films were prepared by nitrogen ion implantation and adsorption at 300 and 900 K and subject to Auger electron analysis in both the low and high energy regions, The nitrogen concentration of implanted films will be uniform over the analysed depth and could be determined by spectrum simulation of the …
Authors
Dawson PT; Tzatzov KK
Journal
Surface Science, Vol. 171, No. 2, pp. 239–254
Publisher
Elsevier
Publication Date
May 1986
DOI
10.1016/0039-6028(86)91078-2
ISSN
0039-6028