Journal article
Si K-edge and Ge K-edge X-ray absorption spectroscopy of the Si-Ge interface in [(Si)m(Ge)n]p atomic layer superlattices
Authors
Hitchcock AP; Tyliszczak T; Aebi P; Xiong JZ; Sham TK; Baines KM; Mueller KA; Feng XH; Chen JM; Yang BX
Journal
Surface Science Letters, Vol. 291, No. 3,
Publisher
Elsevier
Publication Date
July 1993
DOI
10.1016/0167-2584(93)90320-i
ISSN
0167-2584