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Spatially Resolved Diffuse Reflectance...
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Spatially Resolved Diffuse Reflectance Measurements of Two-layered Samples in the Frequency Domain

Abstract

Spatially resolved diffuse reflectance measurements of two layer tissue phantoms were performed in the frequency domain. The non-invasive surface technique can differentiate between homogeneous and layered media. The measurements of the layered phantoms are compared to a diffusion theory model for layered media. It is found that the technique is sensitive to the optical properties of each layer.

Authors

Weersink RA; Patterson MS

Pagination

pp. 15-19

Publication Date

January 1, 1998

Conference proceedings

Optics Infobase Conference Papers