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Testing in the Presence of NOCs
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Testing in the Presence of NOCs

Abstract

The common global on-chip bus is becoming a bottleneck in communication bandwidth and power dissipation. Multi-bus approaches provide temporary alleviation, but the longer-term scalable solution is a Network-on-Chip (NOC). A NOC consists of a network of shared communication links and routers, which connect to the various IP cores through Network Interfaces. NOC-based SOC design seems to be moving from the research phase to first industrial prototypes and finally high-volume products. What does this paradigm shift imply for manufacturing test? How should NOCs be tested, and how can the NOC be leveraged as part of the on-chip test infrastructure? In this session, we explore these and other issues related to the combination of NOCs and test.

Authors

Marinissen EJ; Nicolici N; Cota E; Ivanov A

Pagination

pp. 477-478

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

May 1, 2007

DOI

10.1109/vts.2007.60

Name of conference

25th IEEE VLSI Test Symposium (VTS'07)
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