Conference
Testing in the Presence of NOCs
Abstract
Authors
Marinissen EJ; Nicolici N; Cota E; Ivanov A
Pagination
pp. 477-478
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 1, 2007
DOI
10.1109/vts.2007.60
Name of conference
25th IEEE VLSI Test Symposium (VTS'07)