Conference
Power-Constrained Embedded Memory Bist Architecture
Abstract
A new flexible, hierarchical and distributed power-constrained embedded memory built-in self-test (BIST) architecture for complex and heterogeneous systems-on-a-chip (SOCs) is presented. The proposed architecture consists of a shared technology-independent BIST controller, low area and low power memory BIST wrappers and serial interconnect between them for low routing-overhead. Due to its flexibility, in addition to reducing routing complexity …
Authors
Fang BH; Nicolici N
Pagination
pp. 451-458
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2003
DOI
10.1109/dftvs.2003.1250143
Name of conference
Proceedings. 16th IEEE Symposium on Computer Arithmetic