Conference
Enhanced Photon Detection Probability Model for Single-Photon Avalanche Diodes in TCAD with Machine Learning
Abstract
Accurate photon detection probability (PDP) modeling is important for the optimized design of single-photon avalanche diodes (SPADs) using modern standard CMOS technologies. To ensure a planar active region of a SPAD, the edge of the depletion region must have a lower electric field, so a lower doping concentration is needed. However, this edge effect may have a negative impact on the total PDP, especially for small-sized SPADs. In this paper, …
Authors
Qian X; Jiang W; Deen MJ
Volume
00
Pagination
pp. 1-6
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 4, 2022
DOI
10.1109/iemtronics55184.2022.9795802
Name of conference
2022 IEEE International IOT, Electronics and Mechatronics Conference (IEMTRONICS)