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Detecting Structural and Bonding Changes in EELS...
Journal article

Detecting Structural and Bonding Changes in EELS Near-Edge Structures with a Monochromated TEM

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Authors

Botton G; Wu M-Y; Maunders C; Etheridge J; Whitfield H

Journal

Microscopy and Microanalysis, Vol. 10, No. S02, pp. 86–87

Publisher

Oxford University Press (OUP)

Publication Date

August 1, 2004

DOI

10.1017/s1431927604887543

ISSN

1431-9276

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