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Dislocation Nucleation in MOCVD GaN Films on...
Journal article

Dislocation Nucleation in MOCVD GaN Films on Stepped and Unstepped 4H-SiC Substrates

Authors

Twigg ME; Bassim N; Picard Y; Mastro M; Zega T; Caldwell JD; Henry R; Eddy C; Holm R; Neudeck P

Journal

ECS Meeting Abstracts, Vol. MA2007-02, No. 26, pp. 1349–1349

Publisher

The Electrochemical Society

Publication Date

September 28, 2007

DOI

10.1149/ma2007-02/26/1349

ISSN

2151-2043