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Deep-learning algorithms for imperfection-resilient Fourier-transform spectroscopy in silicon

Abstract

Silicon photonics spectrometers have great potential for applications in medicine and hazard detection. However, silicon spectrometers are very sensitive to fabrication imperfections and environmental conditions. Here, we study the use of deep-learning algorithms to improve tolerance of Fourier-transform spectrometers against fabrication imperfections and temperature variations.

Authors

Mokeddem Z; Melati D; González-Andrade D; Dinh TTD; Montesinos-Ballester M; Cassan E; Marris-Morini D; Grinberg Y; Cheben P; Xu D-X

Volume

00

Pagination

pp. 1-2

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

December 10, 2021

DOI

10.1109/gfp51802.2021.9673932

Name of conference

2021 IEEE 17th International Conference on Group IV Photonics (GFP)