Conference
Deep-learning algorithms for imperfection-resilient Fourier-transform spectroscopy in silicon
Abstract
Silicon photonics spectrometers have great potential for applications in medicine and hazard detection. However, silicon spectrometers are very sensitive to fabrication imperfections and environmental conditions. Here, we study the use of deep-learning algorithms to improve tolerance of Fourier-transform spectrometers against fabrication imperfections and temperature variations.
Authors
Mokeddem Z; Melati D; González-Andrade D; Dinh TTD; Montesinos-Ballester M; Cassan E; Marris-Morini D; Grinberg Y; Cheben P; Xu D-X
Volume
00
Pagination
pp. 1-2
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 10, 2021
DOI
10.1109/gfp51802.2021.9673932
Name of conference
2021 IEEE 17th International Conference on Group IV Photonics (GFP)