Conference
High-Q-factor tellurium oxide clad silicon microring resonators
Abstract
We present the design and experimental measurement of high-Q-factor on-chip tellurium-oxide-coated silicon microring resonators with internal Q factors of up to 1.5 × 106, corresponding to 0.4 dB/cm waveguide loss, at wavelengths around 1550 nm.
Authors
Kiani KM; Bonneville DB; Knights AP; Bradley JDB
Volume
00
Pagination
pp. 1-2
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 10, 2021
DOI
10.1109/gfp51802.2021.9673831
Name of conference
2021 IEEE 17th International Conference on Group IV Photonics (GFP)