Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis

Abstract The design of constant‐stress accelerated life‐test (CSALT) is important in reliability estimation. In reliability studies, practitioners usually rely on underlying distribution to design CSALTs. However, model misspecification analysis of optimal designs has not been examined extensively. This paper considers one‐shot device testing data by assuming gamma, Weibull, lognormal and Birnbaum–Saunders (BS) lifetime distributions, which are …