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Capturing Dislocation Half-Loop Formation and...
Journal article

Capturing Dislocation Half-Loop Formation and Dynamics in Epitaxial Growth Atomistically at Diffusive Time Scales

Abstract

A structural phase-field crystal (XPFC) model is employed to simulate the atomistic mechanisms associated with defect nucleation in mismatched heteroepitaxial growth. Crucially, this approach utilizes a mean-field density field that resolves atomistic features but evolves on diffusional time scales relevant to epitaxial growth. It is used to investigate different degrees of mismatch at the “million atom” level. The half-loop dislocation …

Authors

Rodriguez SV; Frick M; Quitoriano N; Ofori-Opoku N; Provatas N; Bevan KH

Journal

Materialia, Vol. 20, ,

Publisher

Elsevier

Publication Date

12 2021

DOI

10.1016/j.mtla.2021.101253

ISSN

2589-1529