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Atomic force microscope study of crater formation...
Journal article

Atomic force microscope study of crater formation in ion bombarded polymer

Abstract

Polyimide Kapton films with a thickness of 62 μm were bombarded by Ar+, N+, He+ and D+ ions at energies from 10–50 keV. After bombardment at room temperature, the surface topographic changes of the polymer were investigated using an atomic force microscope (AFM). The most common feature of the ion-bombarded Kapton surface is the formation of craters which often have circular shape and rims. The crater sizes suggest they are unlikely to have …

Authors

He D; Bassim MN

Journal

Journal of Materials Science, Vol. 33, No. 14, pp. 3525–3528

Publisher

Springer Nature

Publication Date

7 1998

DOI

10.1023/a:1004634724569

ISSN

0022-2461

Labels

Fields of Research (FoR)