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LOW-FREQUENCY NOISE AND EXCESS CURRENTS DUE TO...
Conference

LOW-FREQUENCY NOISE AND EXCESS CURRENTS DUE TO TRAP-ASSISTED TUNNELING IN DOUBLE-BARRIER RESONANT-TUNNELING DIODES

Authors

DEEN MJ

Editors

Borel J; Gentil P; Noblanc JP; Nouailhat A; Verdone M

Pagination

pp. 355-358

Publisher

EDITIONS FRONTIERES

Publication Date

January 1, 1993

ISBN-10

2-86332-135-8

Name of conference

23rd European Solid State Device Research Conference (ESSDERC 93)

Conference place

GRENOBLE, FRANCE

Conference start date

September 13, 1993

Conference end date

September 16, 1993

Conference proceedings

ESSDERC '93 - PROCEEDINGS OF THE 23RD EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE

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