Conference
The use of constant-resistance DLTs to study proton radiation damages in CCD output MOSFETs
Authors
Kolev PV; Hardy T; Deen MJ; Murowinski R
Editors
RaiChoudhury P; Benton JL; Schroder DK; Shaffner TJ
Series
ELECTROCHEMICAL SOCIETY SERIES
Volume
97
Pagination
pp. 389-399
Publisher
ELECTROCHEMICAL SOCIETY INC
Publication Date
January 1, 1997
ISBN-10
1-56677-139-0
Name of conference
Diagnostic Techniques for Semiconductor Materials and Devices Symposium at the Electrochemical-Society Meeting
Conference place
MONTREAL, CANADA
Conference start date
May 6, 1997
Conference end date
May 8, 1997
Conference proceedings
PROCEEDINGS OF THE ELECTROCHEMICAL SOCIETY SYMPOSIUM ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND DEVICES
Issue
12