Conference
Hot-carrier defect length propagation in LDD NMOSFETs
Authors
Raychaudhuri A; Kwan WS; Deen MJ; King MIH
Editors
Deen MJ; Brown WD; Sundaram KB; Raider SI
Series
ELECTROCHEMICAL SOCIETY SERIES
Volume
97
Pagination
pp. 242-258
Publisher
ELECTROCHEMICAL SOCIETY INC
Publication Date
January 1, 1997
ISBN-10
1-56677-137-4
Name of conference
Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films
Conference place
MONTREAL, CANADA
Conference start date
May 4, 1997
Conference end date
May 9, 1997
Conference proceedings
PROCEEDINGS OF THE SYMPOSIUM ON SILICON NITRIDE AND SILICON DIOXIDE THIN INSULATING FILMS
Issue
10