Conference
CHARACTERIZATION OF HOT-CARRIER EFFECTS IN SHORT CHANNEL NMOS DEVICES USING LOW-FREQUENCY NOISE MEASUREMENTS
Authors
DEEN MJ; QUON C
Editors
ECCLESTON W; UREN M
Pagination
pp. 295-298
Publisher
ADAM HILGER LTD
Publication Date
January 1, 1991
ISBN-10
0-7503-0168-6
Name of conference
7TH BIENNIAL EUROPEAN CONF ON INSULATING FILMS ON SEMICONDUCTORS 1991
Conference place
UNIV LIVERPOOL, LIVERPOOL, ENGLAND
Conference start date
April 2, 1991
Conference end date
April 6, 1991
Conference proceedings
INSULATING FILMS ON SEMICONDUCTORS 1991