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Noise characterization and modeling of polysilicon...
Conference

Noise characterization and modeling of polysilicon emitter bipolar junction transistors at microwave frequencies

Authors

Deen MJ; Ilowski JJ

Volume

285

Pagination

pp. 216-219

Publisher

AIP Publishing

Publication Date

January 1, 1993

DOI

10.1063/1.44577

Name of conference

AIP Conference Proceedings

Conference proceedings

AIP Conference Proceedings

ISSN

0094-243X
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