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NOISE CHARACTERIZATION AND MODELING OF POLYSILICON...
Conference

NOISE CHARACTERIZATION AND MODELING OF POLYSILICON EMITTER BIPOLAR JUNCTION TRANSISTORS AT MICROWAVE-FREQUENCIES

Authors

DEEN MJ; ILOWSKI JJ

Editors

Handel PH; Chung AL

Series

AIP Conference Proceedings

Pagination

pp. 216-219

Publisher

AMER INST PHYSICS

Publication Date

January 1, 1993

ISBN-10

1-56396-270-5

Name of conference

INTERNATIONAL CONF ON NOISE IN PHYSICAL SYSTEMS AND 1/F FLUCTUATION ( ICNF 93 )

Conference place

UNIV MISSOURI, ST LOUIS, MO

Conference start date

1993

Conference proceedings

NOISE IN PHYSICAL SYSTEMS AND 1/F FLUCTUATIONS

Issue

285

ISSN

0094-243X

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